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Cited article:

Physico-chemical environment of Al impurity atoms in amorphous silica

Ph. Jonnard, J.-P. Morreeuw, H. Bercegol

Eur. Phys. J. AP, 21 2 (2003) 147-149

Published online: 2002-11-29

DOI: https://doi.org/10.1051/epjap:2002109

This article has been cited by the following article(s):

Nanometer‐designed Al/SiC periodic multilayers: characterization by a multi‐technique approach

A. Galtayries, M.‐H. Hu, K. Le Guen, J.‐M. André, P. Jonnard, E. Meltchakov, C. Hecquet and F. Delmotte
Surface and Interface Analysis 42 (6-7) 653 (2010)
https://doi.org/10.1002/sia.3393

Characterization of Al and Mg Alloys from Their X-Ray Emission Bands

Philippe Jonnard, Karine Le Guen, Raynald Gauvin and Jean-François Le Berre
Microscopy and Microanalysis 15 (1) 36 (2009)
https://doi.org/10.1017/S1431927609090060

X-ray spectroscopy study of electronic structure of laser-irradiated Au nanoparticles in a silica film

P. Jonnard, H. Bercegol, L. Lamaignère, et al.
Journal of Applied Physics 97 (6) 064306 (2005)
https://doi.org/10.1063/1.1858877