Articles citing this article

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Cited article:

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

F. Beaudoin, K. Sanchez and P. Perdu
Microelectronics Reliability 47 (9-11) 1517 (2007)
https://doi.org/10.1016/j.microrel.2007.07.054

A Statistical Method to Extract MBU Without Scrambling Information

Didier Falguere and Sophie Petit
IEEE Transactions on Nuclear Science 54 (4) 920 (2007)
https://doi.org/10.1109/TNS.2007.903178

Memories Response to MBU and Semi-Empirical Approach for SEE Rate Calculation

S. Petit, J.P. David, D. Falguere, et al.
IEEE Transactions on Nuclear Science 53 (4) 1787 (2006)
https://doi.org/10.1109/TNS.2006.872153

Designing Resistant Circuits against Malicious Faults Injection Using Asynchronous Logic

Y. Monnet, M. Renaudin and R. Leveugle
IEEE Transactions on Computers 55 (9) 1104 (2006)
https://doi.org/10.1109/TC.2006.143