A virtual non contact-atomic force microscope (NC-AFM): Simulation and comparison with analytical models
Eur. Phys. J. AP, 15 2 (2001) 141-147
Published online: 2001-08-15
Articles citing this article
The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
Cited article:
This article has been cited by the following article(s):
Computational Modelling of Nanomaterials
Filippo Federici Canova, John Tracey and David Zhe GaoFrontiers of Nanoscience, Computational Modelling of Nanomaterials 17 187 (2020)
https://doi.org/10.1016/B978-0-12-821495-4.00011-7
Modelling and nanoscale force spectroscopy of frequency modulation atomic force microscopy
Amir Farokh PayamApplied Mathematical Modelling 79 544 (2020)
https://doi.org/10.1016/j.apm.2019.10.051
Steady-state and transient behavior in dynamic atomic force microscopy
Tino WagnerJournal of Applied Physics 125 (4) (2019)
https://doi.org/10.1063/1.5078954
Understanding 2D atomic resolution imaging of the calcite surface in water by frequency modulation atomic force microscopy
John Tracey, Keisuke Miyazawa, Peter Spijker, et al.Nanotechnology 27 (41) 415709 (2016)
https://doi.org/10.1088/0957-4484/27/41/415709
Flexible and modular virtual scanning probe microscope
John Tracey, Filippo Federici Canova, Olli Keisanen, et al.Computer Physics Communications 196 429 (2015)
https://doi.org/10.1016/j.cpc.2015.05.013
Noncontact Atomic Force Microscopy
David Z. Gao, Alexander Schwarz and Alexander L. ShlugerNanoScience and Technology, Noncontact Atomic Force Microscopy 355 (2015)
https://doi.org/10.1007/978-3-319-15588-3_17
Image Calculations with a Numerical Frequency-Modulation Atomic Force Microscope
F. Castanié, L. Nony, S. Gauthier and X. BoujuThe Journal of Physical Chemistry C 117 (20) 10492 (2013)
https://doi.org/10.1021/jp400948a
589 (2013)
https://doi.org/10.1109/ICSTCC.2013.6689023
Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM
Fabien Castanié, Laurent Nony, Sébastien Gauthier and Xavier BoujuBeilstein Journal of Nanotechnology 3 301 (2012)
https://doi.org/10.3762/bjnano.3.34
Phase-Locked loops lock-in range in Frequency Modulated-Atomic Force Microscope nonlinear control system
Átila Madureira Bueno, José Manoel Balthazar and José Roberto Castilho PiqueiraCommunications in Nonlinear Science and Numerical Simulation 17 (7) 3101 (2012)
https://doi.org/10.1016/j.cnsns.2011.11.023
Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator
Daniel Kiracofe, John Melcher and Arvind RamanReview of Scientific Instruments 83 (1) (2012)
https://doi.org/10.1063/1.3669638
The role of the tip in non-contact atomic force microscopy dissipation images of ionic surfaces
F Federici Canova and Adam S FosterNanotechnology 22 (4) 045702 (2011)
https://doi.org/10.1088/0957-4484/22/4/045702
Modelling and simulating scanning force microscopes for estimating measurement uncertainty: a virtual scanning force microscope
Min Xu, Thorsten Dziomba and Ludger KoendersMeasurement Science and Technology 22 (9) 094004 (2011)
https://doi.org/10.1088/0957-0233/22/9/094004
Phase-Locked Loop design applied to frequency-modulated atomic force microscope
Átila Madureira Bueno, José Manoel Balthazar and José Roberto Castilho PiqueiraCommunications in Nonlinear Science and Numerical Simulation 16 (9) 3835 (2011)
https://doi.org/10.1016/j.cnsns.2010.12.018
Noise in frequency-modulation dynamic force microscopy
Jérôme Polesel-Maris, Miguel Angel Venegas de la Cerda, David Martrou and Sébastien GauthierPhysical Review B 79 (23) (2009)
https://doi.org/10.1103/PhysRevB.79.235401
Noncontact Atomic Force Microscopy
A. Raman, R. Reifenberger, J. Melcher and R. TungNanoScience and Technology, Noncontact Atomic Force Microscopy 361 (2009)
https://doi.org/10.1007/978-3-642-01495-6_18
Invited Article: VEDA: A web-based virtual environment for dynamic atomic force microscopy
John Melcher, Shuiqing Hu and Arvind RamanReview of Scientific Instruments 79 (6) (2008)
https://doi.org/10.1063/1.2938864
Is atomic-scale dissipation in NC-AFM real? Investigation using virtual atomic force microscopy
T Trevethan, L Kantorovich, J Polesel-Maris and S GauthierNanotechnology 18 (8) 084017 (2007)
https://doi.org/10.1088/0957-4484/18/8/084017
Novel amplitude and frequency demodulation algorithm for a virtual dynamic atomic force microscope
J Kokavecz, Z Tóth, Z L Horváth, P Heszler and Á MechlerNanotechnology 17 (7) S173 (2006)
https://doi.org/10.1088/0957-4484/17/7/S12
A virtual dynamic atomic force microscope for image calculations
Jérôme Polesel-Maris and Sébastien GauthierJournal of Applied Physics 97 (4) (2005)
https://doi.org/10.1063/1.1841462
Damping and instability in non-contact atomic force microscopy: the contribution of the instrument
G Couturier, R Boisgard, D Dietzel and J P AiméNanotechnology 16 (8) 1346 (2005)
https://doi.org/10.1088/0957-4484/16/8/061
Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach
Martin Stark, Reinhard Guckenberger, Andreas Stemmer and Robert W. StarkJournal of Applied Physics 98 (11) (2005)
https://doi.org/10.1063/1.2137887
Liquid Mechanical Behavior of Mixed Monolayers of Amino and Alkyl Silanes by Atomic Force Microscopy
Pascal Martin, Sophie Marsaudon, Laurent Thomas, et al.Langmuir 21 (15) 6934 (2005)
https://doi.org/10.1021/la050288b
General Theory of Microscopic Dynamical Response in Surface Probe Microscopy: From Imaging to Dissipation
L. N. Kantorovich and T. TrevethanPhysical Review Letters 93 (23) (2004)
https://doi.org/10.1103/PhysRevLett.93.236102
Noncontact atomic force microscopy: Stability criterion and dynamical responses of the shift of frequency and damping signal
G. Couturier, R. Boisgard, L. Nony and J. P. AiméReview of Scientific Instruments 74 (5) 2726 (2003)
https://doi.org/10.1063/1.1564274
Apparent hardening of soft samples through Q factor change in AFM
F Dubourg, J. P Aimé, G Couturier and J SalardenneEurophysics Letters (EPL) 62 (5) 671 (2003)
https://doi.org/10.1209/epl/i2003-00426-2
Spatial variations of current fluctuations in a scanning tunneling microscope
J. Lagoute, T. Zambelli and S. GauthierSurface Science 532-535 1177 (2003)
https://doi.org/10.1016/S0039-6028(03)00471-0
Dissipation induced by attractive interaction in dynamic force microscopy: contribution of adsorbed water layers
L Nony, T Cohen-Bouhacina and J.-P AiméSurface Science 499 (2-3) 152 (2002)
https://doi.org/10.1016/S0039-6028(01)01773-3
Stability analysis of an oscillating tip–cantilever system in NC-AFM
G. Couturier, L. Nony, R. Boisgard and J.-P. AiméApplied Surface Science 188 (3-4) 341 (2002)
https://doi.org/10.1016/S0169-4332(01)00948-5
Noncontact Atomic Force Microscopy
H. J. Hug and A. BaratoffNanoScience and Technology, Noncontact Atomic Force Microscopy 395 (2002)
https://doi.org/10.1007/978-3-642-56019-4_20
Surface mechanical instabilities and dissipation under the action of an oscillating tip
R. Boisgard, J.P. Aimé and G. CouturierSurface Science 511 (1-3) 171 (2002)
https://doi.org/10.1016/S0039-6028(02)01436-X
Stability of an oscillating tip in noncontact atomic force microscopy: Theoretical and numerical investigations
G. Couturier, L. Nony, R. Boisgard and J.-P. AiméJournal of Applied Physics 91 (4) 2537 (2002)
https://doi.org/10.1063/1.1428084