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Cited article:

A comprehensive study of beryllium diffusion in InGaAs using different forms of kick-out mechanism

J. Marcon, S. Koumetz, K. Ketata, M. Ketata and J. G. Caputo
The European Physical Journal Applied Physics 8 (1) 7 (1999)
https://doi.org/10.1051/epjap:1999223