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Cited article:

A study of deposition conditions on charging properties of PECVD silicon nitride films for MEMS capacitive switches

M. Koutsoureli, L. Michalas, A. Gantis and G. Papaioannou
Microelectronics Reliability 54 (9-10) 2159 (2014)
https://doi.org/10.1016/j.microrel.2014.08.002

Ab initiocharacterization of the mechanical and electronic properties ofβ-SiAlON (Si6−zAlzOzN8−z;z=0–5)

Naoto Hirosaki, Cenk Kocer, Shigenobu Ogata and Kazuyoshi Tatsumi
Physical Review B 71 (10) (2005)
https://doi.org/10.1103/PhysRevB.71.104105

The Character of Dislocations in LiCoO[sub 2]

H. Gabrisch, R. Yazami and B. Fultz
Electrochemical and Solid-State Letters 5 (6) A111 (2002)
https://doi.org/10.1149/1.1472257

Multiscale Phenomena in Plasticity: From Experiments to Phenomenology, Modelling and Materials Engineering

Jacques Rabier
Multiscale Phenomena in Plasticity: From Experiments to Phenomenology, Modelling and Materials Engineering 479 (2000)
https://doi.org/10.1007/978-94-011-4048-5_37