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Cited article:

Effect of oxygen annealing treatment on structural, optical and electrical properties of In doped ZnO thin films prepared by PLD technique

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Physica B: Condensed Matter 626 413577 (2022)
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Electrical characterization of ethanol sensing device based on Vanadium oxide/Porous Si/Si structure

K. Chebout, A. Iratni, A. Bouremana, et al.
Solid State Ionics 253 164 (2013)
https://doi.org/10.1016/j.ssi.2013.09.055

Transient and ac electrical transport under forward and reverse bias conditions in aluminum/porous silicon∕p-cSi structures

M. Theodoropoulou, P. K. Karahaliou, C. A. Krontiras, S. N. Georga, N. Xanthopoulos, M. N. Pisanias, C. Tsamis and A. G. Nassiopoulou
Journal of Applied Physics 96 (12) 7637 (2004)
https://doi.org/10.1063/1.1815388