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Cited article:

Simultaneous observation of multiple interferograms with Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope

Tetsuya Akashi, Yoshio Takahashi and Ken Harada
Microscopy 74 (1) 63 (2025)
https://doi.org/10.1093/jmicro/dfae030

Development of a Mach-Zehnder type electron interferometer on a 1.2-MV field-emission transmission electron microscope

Tetsuya Akashi, Yoshio Takahashi and Ken Harada
Microscopy 69 (6) 411 (2020)
https://doi.org/10.1093/jmicro/dfaa040

Performance Analysis of Interaction-Free-Measurement-based Electron Microscopy

Akshay Agarwal, Vivek Goyal and Karl K. Berggren
Microscopy and Microanalysis 25 (S2) 152 (2019)
https://doi.org/10.1017/S1431927619001491

Reduced damage in electron microscopy by using interaction-free measurement and conditional reillumination

Akshay Agarwal, Karl K. Berggren, Yuri J. van Staaden and Vivek K. Goyal
Physical Review A 99 (6) (2019)
https://doi.org/10.1103/PhysRevA.99.063809

A nanofabricated, monolithic, path-separated electron interferometer

Akshay Agarwal, Chung-Soo Kim, Richard Hobbs, Dirk van Dyck and Karl K. Berggren
Scientific Reports 7 (1) (2017)
https://doi.org/10.1038/s41598-017-01466-0