Issue |
Eur. Phys. J. Appl. Phys.
Volume 78, Number 1, April 2017
The 16th European Microscopy Congress (EMC 2016)
|
|
---|---|---|
Article Number | 10701 | |
Number of page(s) | 6 | |
Section | Imaging, Microscopy and Spectroscopy | |
DOI | https://doi.org/10.1051/epjap/2017160394 | |
Published online | 28 April 2017 |
https://doi.org/10.1051/epjap/2017160394
Regular Article
New experiments with a double crystal electron interferometer*
1
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute (PGI), Forschungszentrum Jülich, 52425 Jülich, Germany
2
School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798 Singapore
3
CNR-Institute of Nanoscience-S3, Via G. Campi 213/a, 41125 Modena, Italy
4
CNR-IMEM, Parco delle Scienze 37a, 43100 Parma, Italy
5
Department of Physics and Astronomy, University of Bologna, Viale B. Pichat 6/2, 40127 Bologna, Italy
a e-mail: mduchamp@ntu.edu.sg
Received:
21
October
2016
Revised:
2
February
2017
Accepted:
29
March
2017
Published online: 28 April 2017
Recent advances in transmission electron microscopy and specimen preparation now permit the revival of an old idea, originally pioneered by Marton, of using single crystals as amplitude division beam splitters. As a first step in the direction of realizing a three crystal electron interferometer, we present results obtained from a double crystal interferometer, in which the gap between the two crystals is under experimental control and perfect registry is obtained by using focused ion beam milling to fabricate the interferometer from a single Si crystal.
© EDP Sciences, 2017
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