Articles citing this article

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Cited article:

Modeling of metal-ferroelectric-insulator-semiconductor structure considering the effects of interface traps

Jing Sun, Xiao Rong Shi, Xue Jun Zheng, Li Tian, Zhe Zhu

Eur. Phys. J. Appl. Phys., 70 3 (2015) 30101

Published online: 2015-06-24

DOI: https://doi.org/10.1051/epjap/2015140522

This article has been cited by the following article(s):

The hysteresis-free negative capacitance field effect transistors using non-linear poly capacitance

S.-T. Fan, J.-Y. Yan, D.-C. Lai and C.W. Liu
Solid-State Electronics 122 13 (2016)
https://doi.org/10.1016/j.sse.2016.04.012