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Cited article:
Peng Zhang , Shifeng Mao , Zejun Ding
Eur. Phys. J. Appl. Phys., 69 3 (2015) 30703
Published online: 2015-03-12
This article has been cited by the following article(s):
8 articles
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Critical-dimension scanning electron microscope characterization of smoothly varying wave structures with a Monte Carlo simulation
M S S Khan, L H Yang, X Deng, et al. Journal of Physics D: Applied Physics 54 (44) 445301 (2021) https://doi.org/10.1088/1361-6463/ac0de5
Monte Carlo study for correcting the broadened line‐scan profile in scanning electron microscopy
P. ZHANG Journal of Microscopy 277 (1) 23 (2020) https://doi.org/10.1111/jmi.12860
Monte Carlo Simulation on the CD-SEM Images of SiO2/Si Systems
P. Zhang Microscopy and Microanalysis 25 (4) 849 (2019) https://doi.org/10.1017/S1431927619000552
Exploring the accurate size measurement method for two typical nanostructures basing on SEM imaging
Peng Zhang Micron 126 102756 (2019) https://doi.org/10.1016/j.micron.2019.102756
Study on abnormal SEM contrast image of gold nanorods through Monte Carlo method
Peng Zhang The European Physical Journal Applied Physics 82 (1) 10702 (2018) https://doi.org/10.1051/epjap/2018170436
Exploring the Influence of a Focusing and Gaussian Profile Electron Beam in SEM Imaging through Monte Carlo Simulation
P. Zhang Moscow University Physics Bulletin 73 (1) 89 (2018) https://doi.org/10.3103/S0027134918010174