The Citing articles tool gives a list of articles citing the current article. The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).
This article has been cited by the following article(s):
Automatic Measurement of Silicon Lattice Spacings in High-Resolution Transmission Electron Microscopy Images Through 2D Discrete Fourier Transform and Inverse Discrete Fourier Transform
Critical-dimension scanning electron microscope characterization of smoothly varying wave structures with a Monte Carlo simulation
M S S Khan, L H Yang, X Deng, S F Mao, Y B Zou, Y G Li, H M Li and Z J Ding Journal of Physics D: Applied Physics 54(44) 445301 (2021) https://doi.org/10.1088/1361-6463/ac0de5
Monte Carlo study for correcting the broadened line‐scan profile in scanning electron microscopy