Articles citing this article

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Cited article:

Characterization of a nano line width reference material based on metrological scanning electron microscope

Fang Wang, Yushu Shi, Wei Li, et al.
Chinese Physics B 31 (5) 050601 (2022)
https://doi.org/10.1088/1674-1056/ac3225

Automatic Measurement of Silicon Lattice Spacings in High-Resolution Transmission Electron Microscopy Images Through 2D Discrete Fourier Transform and Inverse Discrete Fourier Transform

Fang Wang, Yushu Shi, Shu Zhang, Xixi Yu and Wei Li
Nanomanufacturing and Metrology 5 (2) 119 (2022)
https://doi.org/10.1007/s41871-022-00129-7

Critical-dimension scanning electron microscope characterization of smoothly varying wave structures with a Monte Carlo simulation

M S S Khan, L H Yang, X Deng, et al.
Journal of Physics D: Applied Physics 54 (44) 445301 (2021)
https://doi.org/10.1088/1361-6463/ac0de5

Monte Carlo study for correcting the broadened line‐scan profile in scanning electron microscopy

P. ZHANG
Journal of Microscopy 277 (1) 23 (2020)
https://doi.org/10.1111/jmi.12860

Study on abnormal SEM contrast image of gold nanorods through Monte Carlo method

Peng Zhang
The European Physical Journal Applied Physics 82 (1) 10702 (2018)
https://doi.org/10.1051/epjap/2018170436

Exploring the Influence of a Focusing and Gaussian Profile Electron Beam in SEM Imaging through Monte Carlo Simulation

P. Zhang
Moscow University Physics Bulletin 73 (1) 89 (2018)
https://doi.org/10.3103/S0027134918010174