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Cited article:

Influence of rapid thermal annealing in vacuum on the resistive switching of Cu/ZnO/ITO devices

Tai-Min Liu, Zong-Wei Wu, Chien-Chen Lee, Pin-Qian Yang, Hua-Shu Hsu and Fang-Yuh Lo
AIP Advances 14 (11) (2024)
https://doi.org/10.1063/5.0241913