Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Instrumented nanoindentation and scanning electron transmission microscopy applied to the study of the adhesion of InP membranes heteroepitaxially bonded to Si

Konstantinos Pantzas, Eric Le Bourhis, Gilles Patriarche, Ahmad Itawi, Grégoire Beaudoin, Isabelle Sagnes, Anne Talneau

Eur. Phys. J. Appl. Phys., 65 2 (2014) 20702

Published online: 2014-02-14

DOI: https://doi.org/10.1051/epjap/2013130389

This article has been cited by the following article(s):

Measuring the surface bonding energy: A comparison between the classical double-cantilever beam experiment and its nanoscale analog

K. Pantzas, F. Fournel, A. Talneau, G. Patriarche and E. Le Bourhis
AIP Advances 10 (4) (2020)
https://doi.org/10.1063/1.5143843

Locally measuring the adhesion of InP directly bonded on sub-100 nm patterned Si

K Pantzas, E Le Bourhis, G Patriarche, et al.
Nanotechnology 27 (11) 115707 (2016)
https://doi.org/10.1088/0957-4484/27/11/115707