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Cited article:

Capacitance–conductance characteristics of Au/Ti/Al2O3/n-GaAs structures with very thin Al2O3interfacial layer

A Turut, A Karabulut, K Ejderha and N Bıyıklı
Materials Research Express 2 (4) 046301 (2015)
https://doi.org/10.1088/2053-1591/2/4/046301