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This article has been cited by the following article(s):
Low-Frequency Noise Modeling of Amorphous Indium–Zinc-Oxide Thin-Film Transistors
Weijie Ye, Yuan Liu, Bingqi Wang, Junkai Huang, Xiaoming Xiong and Wanling Deng IEEE Transactions on Electron Devices 69(11) 6154 (2022) https://doi.org/10.1109/TED.2022.3206274
Low-Frequency Noise Modeling of 4H-SiC Metal-Oxide-Semiconductor Field-Effect Transistors