Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

Spectroscopic study of interfaces in Al/Ni periodic multilayers

K. Le Guen, G. Gamblin, P. Jonnard, M. Salou, J. Ben Youssef, S. Rioual, B. Rouvellou

Eur. Phys. J. Appl. Phys., 45 2 (2009) 20502

Published online: 2009-01-31

DOI: https://doi.org/10.1051/epjap/2008189

This article has been cited by the following article(s):

Temperature-dependent oxidation behavior of thin copper films and formation of gradient copper oxide layers

Roman Petrus and Niklas Nilius
Optical Materials Express 15 (6) 1196 (2025)
https://doi.org/10.1364/OME.558403

Structural View Study on Diamond and Copper Bonding with AlNi Micro/nano Multilayers

Zhang Yupeng, Yi Jianglong, Luo Ziyi, et al.
Rare Metal Materials and Engineering 43 (11) 2597 (2014)
https://doi.org/10.1016/S1875-5372(15)60009-1

Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications

M.-H. Hu, K. Guen, J.-M. André, et al.
Applied Physics A 106 (3) 737 (2012)
https://doi.org/10.1007/s00339-011-6681-9

Characterization of EUV periodic multilayers

K. Le Guen, M.‐H. Hu, J.‐M. André, P. Jonnard, Z. Wang, J. Zhu, A. Galtayries, C. Meny, E. Meltchakov, C. Hecquet and F. Delmotte
X-Ray Spectrometry 40 (5) 338 (2011)
https://doi.org/10.1002/xrs.1350

TEM Characterization of As-Deposited and Annealed Ni/Al Multilayer Thin Film

S. Simões, F. Viana, A.S. Ramos, M.T. Vieira and M.F. Vieira
Microscopy and Microanalysis 16 (6) 662 (2010)
https://doi.org/10.1017/S143192761009392X