Open Access
Issue
Eur. Phys. J. Appl. Phys.
Volume 67, Number 3, September 2014
Article Number 30403
Number of page(s) 24
Section Nanomaterials and Nanotechnologies
DOI https://doi.org/10.1051/epjap/2014140156
Published online 20 August 2014
  1. P. Wojnar, E. Janik, L.T. Baczewski, S. Kret, E. Dynowska, T. Wojciechowski, J. Suffczynski, J. Papierska, P. Kossacki, G. Karczewski, J. Kossut, T. Wojtowicz, Nano. Lett. 12, 3404 (2012) [CrossRef] [PubMed] [Google Scholar]
  2. Y.M. Niquet, C. Delerue, C. Krzeminski, Nano Lett. 12, 3545 (2012) [CrossRef] [PubMed] [Google Scholar]
  3. F. Boxberg, N. Søndergaard, H.Q. Xu, Nano Lett. 10, 1108 (2010) [CrossRef] [PubMed] [Google Scholar]
  4. M. Amato, M. Palummo, S. Ossicini, Mat. Sci. Eng. B 177, 705 (2012) [CrossRef] [Google Scholar]
  5. M.Yu. Gutkin, I.A. Ovid’ko, A.G. Sheinerman, J. Phys. Condens. Matter. 12, 5391 (2000). [CrossRef] [Google Scholar]
  6. J. Grönqvist, N. Søndergaard, F. Boxberg, T. Guhr, S. Åberg, H.Q. Xu, J. Appl. Phys. 106, 53508 (2009) [CrossRef] [Google Scholar]
  7. R. Maranganti, P. Sharma, J. Comput. Theor. Nanosci. 4, 715 (2007) [Google Scholar]
  8. J.F. Nye, Physical Properties of Crystals: Their Representation by Tensors and Matrices (Oxford University Press, Oxford, 1985) [Google Scholar]
  9. I. Tsukrov, B. Drach, Int. J. Solids Structures 47, 25 (2010) [CrossRef] [Google Scholar]
  10. P.M. Marcus, F. Jona, Phys. Rev. B 51, 5263 (1995) [CrossRef] [Google Scholar]
  11. G.L. Bir, G. Pikus, Symmetry and Strain-Induced Effects in Semiconductors (Wiley, New York, 1974) [Google Scholar]
  12. K.E. Aifantis, A.L. Kolesnikova, A.E. Romanov, J. Phil. Mag. 87, 4731 (2007) [CrossRef] [Google Scholar]
  13. J.J. Wortman, R.A. Evans, J. Appl. Phys. 36, 153 (1965) [CrossRef] [Google Scholar]
  14. C.W. Warwick, T.W. Clyne, J. Mater. Sci. 26, 3817 (1991) [CrossRef] [Google Scholar]
  15. R. Koester, J.-S. Hwang, D. Salomon, X.J. Chen, C. Bougerol, J.-P. Barnes, D. Le Si Dang, L. Rigutti, A. de Luna Bugallo, G. Jacopin, M. Tchernycheva, C. Durand, J. Eymery, Nano Lett. 11, 4839 (2011) [CrossRef] [Google Scholar]
  16. J.H. Davies, J. Appl. Phys. 84, 1358 (1998) [CrossRef] [Google Scholar]
  17. K. Herstroffer, R. Mata, D. Camacho, C. Leclere, G. Tourbot, Y.M. Niquet, A. Cros, C. Bougerol, H. Renevier, B. Daudin, Nanotechnology 21, 415702 (2010) [CrossRef] [PubMed] [Google Scholar]
  18. L. Rigutti, G. Jacopin, L. Largeau, E. Galopin, A. de Luna Bugallo, F.H. Julien, J.-C. Harmand, F. Glas, M. Tchernycheva, Phys. Rev. B 83, 155320 (2011) [CrossRef] [Google Scholar]
  19. A. Polian, M. Grimsditch, I. Grzegory, J. Appl. Phys. 79, 3343 (1996) [CrossRef] [Google Scholar]
  20. A.F. Wright, J. Appl. Phys. 82, 2833 (1997) [CrossRef] [Google Scholar]
  21. L.E. McNeil, M. Grimsditch, R.H. French, J. Am. Ceram. Soc. 76, 1132 (1993) [CrossRef] [Google Scholar]
  22. T. Azuhata, M. Takesada, T. Yagi, A. Shikanai, S.F. Chichibu, K. Torii, A. Nakamura, T. Sota, G. Cantwell, D.B. Eason, C.W. Litton, J. Appl. Phys. 94, 968 (2003) [CrossRef] [Google Scholar]
  23. Y.-I. Kim, K. Page, R. Seshadri, Appl. Phys. Lett. 90, 101904 (2007) [CrossRef] [Google Scholar]
  24. R. André, J. Cibert, Le Si Dang, J. Zeman, M. Zigone, Phys. Rev. B 53, 6951 (1996) [CrossRef] [Google Scholar]
  25. A. Beya-Wakata, P.-Y. Prodhomme, G. Bester, Phys. Rev. B 84, 195207 (2011) [CrossRef] [Google Scholar]
  26. F. Boxberg, N. Sondergaard, H.Q. Xu, Adv. Mater. 24, 4692 (2012) [CrossRef] [PubMed] [Google Scholar]
  27. S. Schulz, M.A. Caro, E.P. O’Reilly, O. Marquardt, Phys. Rev. B 84, 125312 (2011) [CrossRef] [Google Scholar]
  28. M. Hocevar, L.T.T. Giang, R. Songmuang, M. den Hertog, L. Besombes, J. Bleuse, Y.-M. Niquet, N.T. Pelekanos, Appl. Phys. Lett. 102, 191103 (2013) [CrossRef] [Google Scholar]
  29. S. Adachi, J. Appl. Phys. 58, R1 (1985) [CrossRef] [Google Scholar]
  30. I. Vurgaftman, J.R. Meyer, L.R. Ram-Mohan, J. Appl. Phys. 89, 5815 (2001) [Google Scholar]
  31. M. Montazeri, M. Fickenscher, L.M. Smith, H.E. Jackson, J. Yarrison-Rice, J. Hyun Kang, Q. Gao, H. Hoe Tan, C. Jagadish, Y. Guo, J. Zou, M.-E. Pistol, C.E. Pryor, Nano Lett. 10, 880 (2010) [CrossRef] [PubMed] [Google Scholar]
  32. A. Artioli, P. Rueda-Fonseca, P. Stepanov, E. Bellet-Amalric, M. Den Hertog, C. Bougerol, Y. Genuist, F. Donatini, R. André, G. Nogues, K. Kheng, S. Tatarenko, D. Ferrand, J. Cibert, Appl. Phys. Lett. 103, 222106 (2013) [CrossRef] [Google Scholar]
  33. W. Wardzynski, W. Giriat, H. Szymczak, R. Kowalczyk, Phys. Status Solidi B 49, 71 (1972) [CrossRef] [Google Scholar]
  34. Le Si Dang, J. Cibert, Y. Gobil, K. Saminadayar, S. Tatarenko, Appl. Phys. Lett. 55, 235 (1989). [CrossRef] [Google Scholar]
  35. D. Berlincourt, H. Jaffe, L.R. Shiozawa, Phys. Rev. 129, 1009 (1963) [CrossRef] [Google Scholar]
  36. J.M. Hartmann, J. Cibert, F. Kany, H. Mariette, M. Charleux, P. Alleyson, R. Langer, G. Feuillet, J. Appl. Phys. 80, 6257 (1996) [CrossRef] [Google Scholar]
  37. M.-E. Pistol, C.E. Pryor, Phys. Rev. B 78, 115319 (2008) [CrossRef] [Google Scholar]
  38. M. Altarelli, N.O. Lipari, Phys. Rev. B 15, 4898 (1977) [CrossRef] [Google Scholar]
  39. G. Fishman, Semi-conducteurs, les bases de la théorie k.p Editions de l’Ecole polytechnique, Paris, 2010 [Google Scholar]
  40. T.E. Trammell, X. Zhang, Y. Li, L.-Q. Chen, E.C. Dickey, J. Cryst. Growth 310, 3084 (2008) [CrossRef] [Google Scholar]
  41. R.M. Martin, Phys. Rev. B 6, 4546 (1972) [CrossRef] [Google Scholar]
  42. D.A. Faux, J.R. Downes, E.P. O’Reilly, J. Appl. Phys. 82, 3754 (1997) [CrossRef] [Google Scholar]
  43. L.J. Zhang, M. d’Avezac, J.-W. Luo, A. Zunger, Nano Lett. 12, 984 (2012) [CrossRef] [PubMed] [Google Scholar]
  44. V. Schmidt, P.C. McIntyre, U. Gösele, Phys. Rev. B 77, 235302 (2008) [CrossRef] [Google Scholar]

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