ED4DSTEM Diffraction data processing and data evaluation with theoretical diffraction profile on 138.4 k frames dataset acquired from Si powder at 30 keV 50 pA 1 ms exposure: a) Si mean diffraction pattern without pre-processing, b) Si virtual mean pattern after peakfinding in each individual experimental frame, c) radial average profile of ED4DSTEM Si ring pattern (blue) in comparison with theoretical Si diffraction profile (orange), d) pipeline for creation of dataset of peak positions and/or peak intensities.