Microstructure and electrical transport properties of nanoscale [(CO₄₀Fe₄₀B₂₀)₃₄(SiO₂)₆₆/(In₂O₃)/C]₄₆ multilayers

¹ Voronezh State University, 394018 Voronezh, Russia
² Voronezh State University of Engineering Technologies, 394036 Voronezh, Russia
³ Voronezh State Technical University, 394026 Voronezh, Russia

^* e-mail: tangar77@mail.ru

Received: 10 October 2022
Revised: 30 November 2022
Accepted: 5 December 2022
Published online: 18 January 2023

Abstract

We investigated the role of microstructure and In₂O₃/C interlayer thickness on the electrical transport properties of [(Co₄₀Fe₄₀B₂₀)₃₄(SiO₂)₆₆/(In₂O₃)/C]₄₆ multilayers prepared using ion-beam sputtering. These multilayers were characterized using an X-ray diffraction, X-ray reflectivity, impedance spectroscopy, and magnetoresistive measurements. The X-ray diffraction data showed that regardless of the layer thickness, all components of the multilayers are X-ray amorphous. Fitting X-ray reflectivity data, multilayer periodicities are extracted and layers thicknesses, densities and roughnesses are determined. Impedance spectroscopy has shown a resistive-capacitive coupling between electrically conductive ferromagnetic CoFeB clusters which corresponds to the model of a prepercolation composite. For the thinnest multilayer with nonmagnetic In₂O₃/C interlayer thickness of about 1.6 nm, we managed to achieve a magnetoresistance of about 0.8% at room temperature and 3.2% at cryogenic temperature.