| Issue |
Eur. Phys. J. Appl. Phys.
Volume 72, Number 2, November 2015
|
|
|---|---|---|
| Article Number | 20501 | |
| Number of page(s) | 7 | |
| Section | Photonics | |
| DOI | https://doi.org/10.1051/epjap/2015150274 | |
| Published online | 30 October 2015 | |
https://doi.org/10.1051/epjap/2015150274
Interference control of transmittance and absorption in ultrathin metal films in the presence of a two-wave field
Radiophysics and Electronics Department, Ulyanovsk State University, ul. L’va Tolstogo 42, 432017
Ulyanovsk, Russia
a e-mail: aleksei_abramov@mail.ru
Received:
28
May
2015
Revised:
22
August
2015
Accepted:
1
September
2015
Published online:
30
October
2015
The focus of research in this article is the reflection, transmission and absorption of microwave radiation by nanometer metal films under oblique incidence of two counter-propagating coherent waves on the opposite surfaces of the film. We demonstrate that at certain values of the angle of incidence and of film thickness the film transmittance can be increased by several orders of magnitude which results in the “lightening” of the metal film. As part of this article’s analysis, we determine the values of film thickness and the angles of incidence at which the near total absorption of incident power is possible.
© EDP Sciences, 2015
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