| Issue |
Eur. Phys. J. Appl. Phys.
Volume 68, Number 3, December 2014
|
|
|---|---|---|
| Article Number | 30301 | |
| Number of page(s) | 5 | |
| Section | Thin Films | |
| DOI | https://doi.org/10.1051/epjap/2014140371 | |
| Published online | 25 November 2014 | |
https://doi.org/10.1051/epjap/2014140371
Semiconducting properties of Tm doped Yb-ZnO films by spray pyrolysis
University of Mohammed V, Faculty of Sciences, Materials Physics Laboratory, B.P. 1014
Rabat, Morocco
a e-mail: a-lefdil@fsr.ac.ma
Received:
16
September
2014
Revised:
25
September
2014
Accepted:
16
October
2014
Published online:
25
November
2014
In this work, we have investigated the structural, optical and electrical properties of rare earth co-doped zinc oxide thin films prepared by spray pyrolysis technique. X-ray diffraction has shown that the films are polycrystalline and textured with the c-axis of the wurtzite structure along the growth direction. Scanning electronic microscopy and transmission electronic microscopy were used to study the films composition and morphology. Photoluminescence measurements showed that all the films have a strong emission band at around 380 nm. Layers with electrical resistivity values as low as 5.7 × 10−2 Ω cm were obtained.
© EDP Sciences, 2014
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