Eur. Phys. J. Appl. Phys.
Volume 68, Number 2, November 2014
|Number of page(s)||9|
|Section||Surfaces and Interfaces|
|Published online||15 October 2014|
Fast Track Article
Comparative study of UV radiation hardness of n+p and p+n duo-lateral position sensitive detectors
Department of Information Technology and Media, Mid Sweden University, Holmsgatan 10, SE-85170
2 SiTek Electro Optics, Ögärdesvägen 13A, SE-43330 Partille, Sweden
a e-mail: email@example.com
Revised: 31 July 2014
Accepted: 12 August 2014
Published online: 15 October 2014
We report experimental results on the degree of radiation damage in two duo-lateral position sensitive detectors (LPSDs) exposed to 193 nm and 253 nm ultraviolet (UV) beam. One of the detectors was an in-house fabricated n+p LPSD and the other was a commercially available p+n LPSD. We report that at both wavelengths, the degradation damage from the UV photons absorption caused a much more significant deterioration in responsivity in the p+n LPSD than in the n+p LPSD. By employing a simple method, we were able to visualize the radiation damage on the active area of the LPSDs using 3-dimensional graphs. We were also able to characterize the impact of radiation damage on the linearity and position error of the detectors.
© EDP Sciences, 2014
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.