Eur. Phys. J. Appl. Phys.
Volume 68, Number 2, November 2014
|Number of page(s)||9|
|Section||Surfaces and Interfaces|
|Published online||15 October 2014|
Fast Track Article
Comparative study of UV radiation hardness of n+p and p+n duo-lateral position sensitive detectors
Department of Information Technology and Media, Mid Sweden University, Holmsgatan 10, SE-85170
2 SiTek Electro Optics, Ögärdesvägen 13A, SE-43330 Partille, Sweden
a e-mail: firstname.lastname@example.org
Revised: 31 July 2014
Accepted: 12 August 2014
Published online: 15 October 2014
We report experimental results on the degree of radiation damage in two duo-lateral position sensitive detectors (LPSDs) exposed to 193 nm and 253 nm ultraviolet (UV) beam. One of the detectors was an in-house fabricated n+p LPSD and the other was a commercially available p+n LPSD. We report that at both wavelengths, the degradation damage from the UV photons absorption caused a much more significant deterioration in responsivity in the p+n LPSD than in the n+p LPSD. By employing a simple method, we were able to visualize the radiation damage on the active area of the LPSDs using 3-dimensional graphs. We were also able to characterize the impact of radiation damage on the linearity and position error of the detectors.
© EDP Sciences, 2014
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