Eur. Phys. J. Appl. Phys.
Volume 66, Number 1, April 2014
|Number of page(s)||5|
|Section||Imaging, Microscopy and Spectroscopy|
|Published online||21 April 2014|
Virtual dark-field images reconstructed from electron diffraction patterns
Science et Ingénierie des Matériaux et des Procédés – (CNRS UMR 5266) INPG-UJF, BP 46, 38402
Saint Martin d’Hères Cedex, France
a e-mail: email@example.com
Revised: 14 March 2014
Accepted: 18 March 2014
Published online: 21 April 2014
Bright- and dark-field images are reconstructed by extracting the intensities of selected spots from a succession of digitalized electron diffraction patterns collected using a transmission electron microscope by scanning the focused beam over the area of interest. The procedure is similar to the generation of the scanning-transmission electron microscopy images. Several examples are shown to illustrate the flexibility and potentiality of such numerical off-line reconstruction.
© EDP Sciences, 2014
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