| Issue |
Eur. Phys. J. Appl. Phys.
Volume 66, Number 1, April 2014
|
|
|---|---|---|
| Article Number | 10701 | |
| Number of page(s) | 5 | |
| Section | Imaging, Microscopy and Spectroscopy | |
| DOI | https://doi.org/10.1051/epjap/2014130556 | |
| Published online | 21 April 2014 | |
https://doi.org/10.1051/epjap/2014130556
Virtual dark-field images reconstructed from electron diffraction patterns
Science et Ingénierie des Matériaux et des Procédés – (CNRS UMR 5266) INPG-UJF, BP 46, 38402
Saint Martin d’Hères Cedex, France
a e-mail: edgar.rauch@simap.grenoble-inp.fr
Received:
6
December
2013
Revised:
14
March
2014
Accepted:
18
March
2014
Published online:
21
April
2014
Bright- and dark-field images are reconstructed by extracting the intensities of selected spots from a succession of digitalized electron diffraction patterns collected using a transmission electron microscope by scanning the focused beam over the area of interest. The procedure is similar to the generation of the scanning-transmission electron microscopy images. Several examples are shown to illustrate the flexibility and potentiality of such numerical off-line reconstruction.
© EDP Sciences, 2014
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