Eur. Phys. J. Appl. Phys.
Volume 66, Number 1, April 2014
|Number of page(s)||5|
|Section||Imaging, Microscopy and Spectroscopy|
|Published online||21 April 2014|
Virtual dark-field images reconstructed from electron diffraction patterns
Science et Ingénierie des Matériaux et des Procédés – (CNRS UMR 5266) INPG-UJF, BP 46, 38402
Saint Martin d’Hères Cedex, France
a e-mail: firstname.lastname@example.org
Revised: 14 March 2014
Accepted: 18 March 2014
Published online: 21 April 2014
Bright- and dark-field images are reconstructed by extracting the intensities of selected spots from a succession of digitalized electron diffraction patterns collected using a transmission electron microscope by scanning the focused beam over the area of interest. The procedure is similar to the generation of the scanning-transmission electron microscopy images. Several examples are shown to illustrate the flexibility and potentiality of such numerical off-line reconstruction.
© EDP Sciences, 2014
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.