Eur. Phys. J. Appl. Phys.
Volume 62, Number 1, April 2013
|Number of page(s)||4|
|Section||Nanomaterials and Nanotechnologies|
|Published online||28 March 2013|
Enhanced critical current density using Nd2O3 nano-islands on NdBa2Cu3O7–δ thin films prepared by PLD
K. K. Education Faculty, Department of Physics, Atatürk University, Erzurum, Turkey
2 Graduate School of Natural and Applied Sciences, Department of Nanoscience and Nanoengineering, Advanced Materials Research Laboratory, Atatürk University, 25240 Erzurum, Turkey
3 Engineering Faculty, Department of Electric-Electronic, Atatüsrk University, Erzurum, Turkey
a e-mail: email@example.com
Revised: 2 February 2013
Accepted: 6 February 2013
Published online: 28 March 2013
In this study, the effect of Nd2O3 nano-islands on the critical properties of NdBa2Cu3O7–δ (Nd-123) superconductive thin films grown on Ni-W metallic substrates was investigated. Nd-123 superconducting ceramic materials were prepared by solid-state reaction technique and then this ceramic material was used as target for producing the Nd-123 superconductive thin films with pulsed laser deposition (PLD). Nano-islands were prepared with the deposition of Nd2O3 by PLD. The obtained superconductive thin films were characterized by X-ray diffraction (XRD) analysis, morphological investigations of atomic force microscopy (AFM) images, transport analysis such as Jc and R-T measurements by four-point probe (FPP). As a result of these analyses, it was determined that nano-islands have important role for the flux pinning and it provides the increase of about 32% for the critical current value (Jc).
© EDP Sciences, 2013
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.