Eur. Phys. J. Appl. Phys.
Volume 61, Number 2, February 2013
Topical issue: 13th International Symposium on High Pressure Low Temperature Plasma Chemistry (Hakone XIII). Edited by Nicolas Gherardi, Henryca Danuta Stryczewska and Yvan Ségui
|Number of page(s)||7|
|Section||Plasma, Discharges and Processes|
|Published online||15 February 2013|
Measurement of secondary ionization coefficient of CaO film electrode *
Department of Electrical, Electronic and Computer Engineering, Chiba Institute of Technology, Narashino, Chiba 275-0016, Japan
2 Department of Electrical and Electronic Engineering, Kisarazu National College of Technology, Kiyomidaihigashi, Kisarazu, Chiba 292-0041, Japan
a e-mail: firstname.lastname@example.org
Revised: 4 December 2012
Accepted: 5 December 2012
Published online: 15 February 2013
The secondary ionization coefficient γ of a CaO film electrode is investigated taking into account the difference in breakdown voltage obtained by repeated voltage applications. Such measurement is performed under a sinusoidal voltage of 0.5 Hz. If the CaO film electrode acts as the cathode, breakdown voltage gradually decreases and converges to an almost constant value after several breakdowns. From the obtained results, the γ of the CaO film electrode is determined for each breakdown using Townsend’s criterion. The γ in the first breakdown is lower than those in subsequent breakdowns, particularly in the steady state. The difference in γ is considered to originate from accumulated charges on the CaO film electrode.
© EDP Sciences, 2013
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