| Issue |
Eur. Phys. J. Appl. Phys.
Volume 53, Number 2, February 2011
|
|
|---|---|---|
| Article Number | 21501 | |
| Number of page(s) | 4 | |
| Section | Surfaces and Interfaces | |
| DOI | https://doi.org/10.1051/epjap/2010100312 | |
| Published online | 28 January 2011 | |
https://doi.org/10.1051/epjap/2010100312
Variations of surface roughness for deposition of Co-sputtered-ZnO(002) by Auger electron spectroscopy and surface magneto-optic Faraday effect
1
Department of Electrophysics, National Chiayi University, 60004 Chiayi, Taiwan
2
Department of Physics, National Cheng Kung University, 1 University Rd., 70101 Tainan, Taiwan
Corresponding author: cwsu@mail.ncyu.edu.tw
Received:
12
August
2010
Accepted:
29
November
2010
Published online:
28
January
2011
Auger electron spectroscopy and the surface magneto-optical Faraday effect were used to monitor the deposition of Co ultrathin films on an initially rough ZnO(002) crystal surface. The magnetic properties of the epitaxial films were compared with those associated with that the structure properties in a 3D island growth mode. The magneto-optic signals are very sensitive to the thickness of the Co film structure, even if it is rough. The ZnO(002) substrate surface formed by routine ion sputtering may exhibit short-range ordering in the initial sample preparation. The roughness of a sputtered substrate surface can be determined from the sensitive magneto-optical signals, especially when ultrathin films are deposited in the initial stage of growth.
© EDP Sciences, 2011
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.