Issue |
Eur. Phys. J. Appl. Phys.
Volume 52, Number 3, December 2010
|
|
---|---|---|
Article Number | 30501 | |
Number of page(s) | 7 | |
Section | Thin Films | |
DOI | https://doi.org/10.1051/epjap/2010159 | |
Published online | 30 November 2010 |
https://doi.org/10.1051/epjap/2010159
Electronic structure of aluminum oxide: ab initio simulations of α and γ phases and comparison with experiment for amorphous films
1
Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences, Academician Lavrentiev Ave. 13, 630090 Novosibirsk, Russia
2
Boreskov Institute of Catalysis, Siberian Branch of the Russian Academy of Sciences, Academician Lavrentiev Ave. 5, 630090 Novosibirsk, Russia
Corresponding authors: timson@isp.nsc.ru grits@isp.nsc.ru vvk@catalysis.nsk.su
Received:
28
May
2010
Accepted:
10
August
2010
Published online:
30
November
2010
The electronic structure of γ-Al2O3 and α-Al2O3 has been investigated by means of the density functional
theory. A comparison of the calculation results with experimental data for
amorphous alumina films is also presented. The electronic structure is
described in terms of band structure and density of states. It has been
found that γ-Al2O3 have similar electronic structure with
α-Al2O3 and amorphous Al2O3. Effective electron
masses in γ-Al2O3 as well as in α-Al2O3
equal to ≈ 0.4 m0 that is in a good agreement with the
experimentally found tunnel electron mass in amorphous Al2O3. The
heavy holes in both alumina crystals are explained by the valence band top
forming by O 2pπ nonbonding orbitals.
© EDP Sciences, 2010
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