Eur. Phys. J. Appl. Phys.
Volume 51, Number 2, August 2010
|Number of page(s)||7|
|Section||Instrumentation and Metrology|
|Published online||07 July 2010|
Sub-wavelength surface IR imaging of soft-condensed matter
School of Chemical Science and Pharmacy, University of East Anglia, Norwich, NR4 7TJ, UK
2 Ginzton Laboratory, Stanford University, Stanford, 94305-4088 CA, USA
Corresponding author: firstname.lastname@example.org
Revised: 27 May 2010
Accepted: 3 June 2010
Published online: 7 July 2010
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.
© EDP Sciences, 2010
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