| Issue |
Eur. Phys. J. Appl. Phys.
Volume 51, Number 2, August 2010
|
|
|---|---|---|
| Article Number | 21202 | |
| Number of page(s) | 7 | |
| Section | Instrumentation and Metrology | |
| DOI | https://doi.org/10.1051/epjap/2010093 | |
| Published online | 07 July 2010 | |
https://doi.org/10.1051/epjap/2010093
Sub-wavelength surface IR imaging of soft-condensed matter
1
School of Chemical Science and Pharmacy, University of East Anglia, Norwich, NR4 7TJ, UK
2
Ginzton Laboratory, Stanford University, Stanford, 94305-4088 CA, USA
Corresponding author: james.rice@ucd.ie
Received:
19
April
2010
Revised:
27
May
2010
Accepted:
3
June
2010
Published online:
7
July
2010
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface excitation illumination approach to perform simultaneously chemical mapping and AFM topography imaging with an image resolution of 200 nm. This method was demonstrated by imaging polystyrene micro-structures.
© EDP Sciences, 2010
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