Eur. Phys. J. Appl. Phys.
Volume 48, Number 2, November 2009
|Number of page(s)||6|
|Section||Plasma, Discharges and Processes|
|Published online||17 September 2009|
Enhancing soft X-ray emission with depleted uranium in neon plasma focus
Department of Physics, Quaid-i-Azam University, 45320 Islamabad,
Corresponding author: email@example.com
Revised: 11 May 2009
Accepted: 18 May 2009
Published online: 17 September 2009
Depleted uranium (U is used for pre-ionization in the neon gas to study the soft X-ray emission in a Mather type plasma focus of 3.3 kJ. The X-rays are detected using an assembly of Quantrad Si pin diodes, masked with differential Ross fitters, and with a multi pinhole camera. The X-ray yield and pinhole images are found strongly influenced by the preionization and the pressure of the working gas. The soft X-ray yield of 82.5 ± 4.0 J in 1.3–1.56 keV energy window is obtained in the case of preionization of neon gas at the optimum pressure of 5 mbar, leading to the conversion efficiency of 2.5% of the stored energy. The total yield with preionization is 195 ± 9.0 J in 4π geometry measured at the optimum pressure of 5 mbar giving conversion efficiency of 5.9%. The time integrated images indicate the broadening of X-ray emission zone with preionization.
PACS: 52.58.lq – Z-pinches, plasma focus, and other pinch devices / 52.38.ph – X-ray, gamma-ray, and particle generation / 52.40.kh – Plasma sheaths / 52.25.os – Emission, absorption, and scattering of electromagnetic radiation
© EDP Sciences, 2009
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