Substrate temperature dependence of the structure of polythiophene thin films obtained by Matrix Assisted Pulsed Laser Evaporation (MAPLE)

¹ CNR-INFM Coerenthia c/o Università degli Studi di Napoli Federico II, Piazzale Tecchio 80, 80125 Napoli, Italy
² Dipartimento di Scienze Fisiche, Università degli Studi di Napoli Federico II, Piazzale Tecchio 80, 80125 Napoli, Italy
³ Department of Materials and Production Engineering, Università degli Studi di Napoli Federico II, Piazzale Tecchio 80, 80125 Napoli, Italy
⁴ Nanomed Labs, Department of Physics, Università of Genova and Advanced Biotechnology Center, Via Dodecaneso 33, 16146 Genova, Italy
⁵ Department of Chemistry, Università degli Studi di Napoli Federico II, Via Cinthia, 80124 Napoli, Italy

Corresponding author: valeriacalifano@hotmail.com

Received: 13 March 2009
Accepted: 11 May 2009
Published online: 21 July 2009

Abstract

Thin films of head-tail (H-T) regio-regular poly[3-(4-octyloxyphenyl) thiophene] (POOPT) were grown using the MAPLE (Matrix Assisted Pulsed Laser Evaporation) technique in which the target is a frozen solution of the polymer in chloroform. Target evaporation was obtained by laser irradiation at 1064 nm and substrates were kept at different temperatures. Information concerning the preservation of the polymer local chemical structure following laser irradiation was obtained by FTIR (Fourier Transform InfraRed) spectroscopy. Based on FTIR data, the chemical structure of the deposited polymer seemed to undergo little or no damage. From UV-Visible spectroscopic analysis, it turned out that the degree of order of the film is strongly affected by the substrate temperature: the polymer was deposited in a disordered form on the substrate at room temperature whereas on the hot surface we locally obtained the π-stacked structure characteristic of polythiophenes. Atomic force microscopy (AFM) images showed that the polymer formed aggregates of different dimensions (<1 μm to 5 μm) with a columnar shape and showed micrometric domains with sharp and apparently regular edges for the film grown on a hot substrate. Electrical measurements performed by a standard two-probe technique confirm that the structural order degree strongly affects the film charge transport properties.