Eur. Phys. J. Appl. Phys.
Volume 45, Number 3, March 2009
|Number of page(s)||6|
|Section||Nanomaterials and Nanotechnologies|
|Published online||06 February 2009|
Absorption and dispersion studies of thermally evaporated nanocrytallite structure ZnIn2Se4 thin films
Department of Physics, Faculty of science at Damietta, New Damietta 34517, Egypt
Corresponding author: email@example.com
Revised: 5 December 2008
Accepted: 12 December 2008
Published online: 6 February 2009
ZnIn2Se4 has a polycrystalline structure in as synthesized condition. It transforms to nanostructure grains of ZnIn2Se4 upon thermal deposition as thin films. The optical properties of as deposited ZnIn2Se4 films are studied using spectrophotometer measurements of transmittance and reflectance at normal incidence of light in wavelength range (450–2500) nm. The refractive index and absorption index are calculated and it is found that they are independent of film thickness in the thickness range (500–790) nm. Absorption analysis showed two types of electronic transitions; indirect allowed transition with energy gap 1.76 eV accompanied by phonon of energy 25 meV and direct allowed transition with energy gap 2.3 eV. The dispersion analysis showed that the oscillator energy, dispersion energy, dielectric constant at infinite frequency and lattice dielectric constant are 2.49 eV, 14.36 eV, 6.84 and 8.17, respectively.
PACS: 81.40.Tv – Optical and dielectric properties (related to treatment conditions)
© EDP Sciences, 2009
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