| Issue |
Eur. Phys. J. Appl. Phys.
Volume 42, Number 3, June 2008
|
|
|---|---|---|
| Page(s) | 219 - 228 | |
| Section | Surfaces, Interfaces and Films | |
| DOI | https://doi.org/10.1051/epjap:2008067 | |
| Published online | 30 April 2008 | |
https://doi.org/10.1051/epjap:2008067
Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra
University of Rousse, Physics Department, 7017 Rousse, Bulgaria
Corresponding author: mnenkov@ru.acad.bg
Received:
22
December
2007
Revised:
27
February
2008
Accepted:
4
March
2008
Published online:
30
April
2008
A novel approach for determination of refractive index dispersion n(λ) and thickness d of thin films of negligible absorption and weak dispersion is proposed. The calculation procedure is based on determination of the phase thickness of the film in the spectral region of measured transmittance data. All points of measured spectra are included in the calculations. Barium titanate and titanium oxide thin films are investigated and their n(λ) and d are calculated. The approach is validated using Swanepoel's method and it is found to be applicable for relatively thinner films when measured transmittance spectra have one minimum and one maximum only.
PACS: 78.20.-e – Optical properties of bulk materials and thin films / 78.20.Ci – Optical constants
© EDP Sciences, 2008
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