| Issue |
Eur. Phys. J. Appl. Phys.
Volume 40, Number 3, December 2007
|
|
|---|---|---|
| Page(s) | 305 - 310 | |
| Section | Characterization of Materials: Imaging, Microscopy and Spectroscopy | |
| DOI | https://doi.org/10.1051/epjap:2007163 | |
| Published online | 13 December 2007 | |
https://doi.org/10.1051/epjap:2007163
Speckle size, intensity and contrast measurement application in micron-size particle concentration assessment
Physics department, University Lucian Blaga, Str. Dr. Ion Ratiu 7–9, 550012
Sibiu, Romania
Corresponding author: dan.chicea@ulbsibiu.ro
Received:
7
April
2007
Accepted:
11
September
2007
Published online:
13
December
2007
A transmission type of experiment was set-up to investigate coherent light scattering on suspensions with scattering centers having a wider size distribution. For each sample the contrast, the average intensity and the average speckle size of the far interference field were calculated using an alternative simple algorithm that is presented in detail. The variation of the far field parameters with the scattering centers concentration is presented. A possible application in measuring the scattering centers concentration in the very small values range is suggested and the range is indicated.
PACS: 42.30.Ms – Speckle and moire patterns / 42.30.Va – Image forming and processing
© EDP Sciences, 2007
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.