Eur. Phys. J. Appl. Phys.
Volume 37, Number 3, March 2007
|Page(s)||291 - 297|
|Section||Characterization of Materials: Imaging, Microscopy and Spectroscopy|
|Published online||14 February 2007|
On X-ray tube spectra, the dependence on the angular and electron energy of X-rays from the targets
Spectroscopy Department, Physics Division, National Research Centre, El
Behooth Str., 12311 Dokki, Cairo, Egypt
Corresponding author: firstname.lastname@example.org
Revised: 16 October 2006
Accepted: 20 November 2006
Published online: 14 February 2007
An algorithm was developed for the theoretical intensities of both X-ray continuum and characteristic K-radiation (Kα1, Kα2, Kα, Kβ1, Kβ2, Kβ3, Kβ13, Kβ4 and Kβ5) of different target materials (Cr, Cu, Rh, Mo, W, Ag and Au) at different electron incidence angles (0.01° − 90°), different take-off angles of the photon emission (0.01° − 90°) and different X-ray tube voltages. It was found that the intensities of continuum and characteristic X-rays increase with increasing take-off angle and the take-off angle is inversely proportional to the absorption path of X-rays in the target. At take-off angles of 20° or more, the flux of the X-ray spectra remains practically independent of the take-off angle. Furthermore, at the optimum electron incidence angle and take-off angle of emitted X-ray photons, the dependence of X-ray tube spectra on applied voltage was also investigated.
PACS: 32.30.Rj – X-ray spectra / 33.20.Rm – X-ray spectra / 32.70.-n – Intensities and shapes of atomic spectral lines / 32.70.Fw – Absolute and relative intensities
© EDP Sciences, 2007
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