| Issue |
Eur. Phys. J. Appl. Phys.
Volume 35, Number 3, September 2006
|
|
|---|---|---|
| Page(s) | 211 - 216 | |
| Section | Instrumentation and Metrology | |
| DOI | https://doi.org/10.1051/epjap:2006090 | |
| Published online | 23 August 2006 | |
https://doi.org/10.1051/epjap:2006090
Detector calibration at INM using a correlated photons source*
INM/CNAM, 61 rue du Landy, 93210 La Plaine Saint-Denis, France
Corresponding author: razet@cnam.fr
Received:
12
May
2005
Revised:
8
March
2006
Accepted:
7
April
2006
Published online:
23
August
2006
The correlated photons source is obtained from the parametric down conversion of photons generated in a non linear crystal. When associated with a system of coincidences counting, this source allows one to measure the detection efficiencies of detectors working at photon counting levels, without the need for reference sources or detectors. At the Institut National de Métrologie (France), this method was implemented with the aim of realising a new standard detector for the absolute measurement of very weak radiations. The relative standard uncertainty of the detection efficiency measurements is 1.1%.
PACS: 06.20.-f – Metrology / 42.65.Lm – Parametric down conversion and production of entangled photons / 85.60.Dw – Photodiodes; phototransistors; photoresistors
© EDP Sciences, 2006
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