| Issue |
Eur. Phys. J. Appl. Phys.
Volume 30, Number 1, April 2005
|
|
|---|---|---|
| Page(s) | 51 - 56 | |
| Section | Plasma, Discharges and Processes | |
| DOI | https://doi.org/10.1051/epjap:2005002 | |
| Published online | 28 January 2005 | |
https://doi.org/10.1051/epjap:2005002
Study of transient processes in nitrogen by measurements of dynamic breakdown voltages
1
Department of Physics, University of Niš, PO Box
224, 18001 Niš, Serbia and Montenegro
2
Institute of
Physics, PO Box 68, 11080 Belgrade, Serbia and Montenegro
Corresponding author: vidosav@pmf.ni.ac.yu
Received:
9
September
2003
Revised:
20
August
2004
Accepted:
22
October
2004
Published online:
28
January
2005
In this paper the measurements of the dynamic breakdown
voltages Ub for linearly rising pulses in nitrogen at low
pressure are presented. The measurements were carried out for the
rates of voltage rise k up to 
. Dependence of the
breakdown voltages, delay times and electron yields on the rate of
rise were obtained experimentally and theoretically
under different conditions. It was found that
the overvoltage 
and the mean effective
electron yield 
is proportional to 
(Y
is a number of generated electrons in the interelectrode space per
second and P the breakdown probability), while the statistical
time delay 
is proportional to 
. In the
second part, the experimental breakdown voltage distributions were
obtained, fitted by theoretical distributions and some breakdown
parameters relevant to experimental conditions were determined.
Based on the approximate analytical and numerical models, the
dependence of the effective secondary electron yield γ on
the overvoltage and on the rate of voltage rise were derived from
these measurements. It was found that γ varies linearly
with the overvoltage for a constant k, and the slope of γ
is proportional to .
PACS: 51.50.+v: – Electrical properties (ionization, breakdown, electron and ion mobility, etc.) / 52.20.-j – Elementary processes in plasma / 52.80.-s – Electric discharges
© EDP Sciences, 2005
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