| Issue |
Eur. Phys. J. Appl. Phys.
Volume 26, Number 1, April 2004
|
|
|---|---|---|
| Page(s) | 35 - 43 | |
| Section | Laser, Optics, Optoelectronics and Nanophotonics | |
| DOI | https://doi.org/10.1051/epjap:2004014 | |
| Published online | 04 March 2004 | |
https://doi.org/10.1051/epjap:2004014
Imaging subwavelength holes in chromium films in scanning near-field optical microscopy. Comparison between experiments and calculation
1
CNRS UPR and Univ.
P. et M. Curie., Lab. d'Optique
Physique, ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05,
France
2
Laboratoire d'Optique P.M.
Duffieux, CNRS UMR 6603, Université de
Franche-Comté,
25030 Besançon Cedex, France
3
Department of Electrical
Engineering, Technion – Israel Institute of Technology, Haifa
32000, Israel
Corresponding author: rivoal@optique.espci.fr
Received:
19
August
2003
Revised:
19
November
2003
Accepted:
15
January
2004
Published online:
4
March
2004
Near-field optical signals are imaged in the vicinity of nano-holes using two different near-field optical microscopes. The experimental results are compared with electromagnetic field calculations based on a modal approximation. It turns out that an optical fibre detects the Poynting vector whereas the apertureless tip is sensitive to the field amplitude.
PACS: 68.37.-d – Microscopy of surfaces, interfaces and thin films / 07.79.Fc – Near-field scanning optical microscopes / 07.79.Lh – Atomic force microscopes
© EDP Sciences, 2004
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