Eur. Phys. J. Appl. Phys.
Volume 26, Number 1, April 2004
|Page(s)||35 - 43|
|Section||Laser, Optics, Optoelectronics and Nanophotonics|
|Published online||04 March 2004|
Imaging subwavelength holes in chromium films in scanning near-field optical microscopy. Comparison between experiments and calculation
CNRS UPR and Univ.
P. et M. Curie., Lab. d'Optique
Physique, ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05,
2 Laboratoire d'Optique P.M. Duffieux, CNRS UMR 6603, Université de Franche-Comté, 25030 Besançon Cedex, France
3 Department of Electrical Engineering, Technion – Israel Institute of Technology, Haifa 32000, Israel
Corresponding author: firstname.lastname@example.org
Revised: 19 November 2003
Accepted: 15 January 2004
Published online: 4 March 2004
Near-field optical signals are imaged in the vicinity of nano-holes using two different near-field optical microscopes. The experimental results are compared with electromagnetic field calculations based on a modal approximation. It turns out that an optical fibre detects the Poynting vector whereas the apertureless tip is sensitive to the field amplitude.
PACS: 68.37.-d – Microscopy of surfaces, interfaces and thin films / 07.79.Fc – Near-field scanning optical microscopes / 07.79.Lh – Atomic force microscopes
© EDP Sciences, 2004
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