Issue |
Eur. Phys. J. AP
Volume 19, Number 1, July 2002
|
|
---|---|---|
Page(s) | 69 - 74 | |
Section | Instrumentation and Metrology | |
DOI | https://doi.org/10.1051/epjap:2002050 | |
Published online | 28 June 2002 |
https://doi.org/10.1051/epjap:2002050
L-shell fluorescence cross-sections and relative intensities for La, Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Tm, Yb, and Lu at 16.9 keV
Physics Department, The Hashemite University, Zarqa 13115, Jordan
Corresponding author: wael_salahh@hotmail.com
Received:
26
March
2002
Revised:
29
April
2002
Accepted:
30
April
2002
Published online:
28
June
2002
Using a high-resolution Si(Li) X-ray detector, the Lα, Lβ and Lγ X-ray fluorescence cross sections and the relative intensities for elements with 57 ≤ Z ≤ 71 were measured at photon incident energy of 16.9 keV. We also theoretically calculated these cross sections, and discussed the experimental results in comparison with the theoretical values. As a result, we have found that our experimental results are in good agreement with the theoretical ones.
PACS: 32.30.Rj – X-Ray spectra / 32.50.+d – Fluorescence, phosphorescence
© EDP Sciences, 2002
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