Eur. Phys. J. AP
Volume 17, Number 1, January 2002
|Page(s)||81 - 84|
|Section||Instrumentation and Metrology|
|Published online||15 January 2002|
A simple EDXRF technique to analyse alloys
Department of Physics, University of Burdwan, Burdwan 713104, India
2 Saha Institute of Nuclear Physics, 1/AF, Bidhannagar, Kolkata 700064, India
Corresponding author: firstname.lastname@example.org
Accepted: 24 October 2001
Published online: 15 January 2002
A simple EDXRF technique to obtain the relative concentrations of different elements present in a sample is described here. Only those elements have been considered whose characteristic X-rays fall within the sensitivity range of the X-ray detector that we used. A small computer program where the fundamental parameters such as photoionisation cross sections, fluorescence yields, Coster-Kronig transition rates, etc. have been used as inputs was written to calculate the relative concentrations of the elements. The technique used here requires only a single run with the sample and does not require any knowledge of the incoming X-ray flux or geometry of the experimental arrangement. Using this method, three alloys have been analysed in our existing EDXRF system.
PACS: 32.50.+d – Fluorescence, phosphorescence (including quenching) / 81.70.-q – Methods of materials testing and analysis
© EDP Sciences, 2002
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