| Issue |
Eur. Phys. J. AP
Volume 16, Number 3, December 2001
|
|
|---|---|---|
| Page(s) | 175 - 182 | |
| Section | Semiconductors and Devices | |
| DOI | https://doi.org/10.1051/epjap:2001207 | |
| Published online | 15 December 2001 | |
https://doi.org/10.1051/epjap:2001207
First stages of martensitic growth studied by TEM in a Cu-Al-Ni single crystal and associated mechanical spectroscopy instabilities
Laboratoire de Mécanique et de Physique des Matériaux (UMR CNRS 6617), ENSMA,
BP 40109, 86961 Futuroscope-Chasseneuil Cedex, France
Corresponding author: pelosin@lmpm.ensma.fr
Received:
18
April
2001
Revised:
12
July
2001
Accepted:
26
July
2001
Published online: 15 December 2001
The martensitic transition of a Cu-Al-Ni single crystal has been studied by isothermal mechanical spectroscopy and in situ transmission electron microscopy (TEM) observations. A damping instability (with time) has been found at low frequency at the beginning of the transition. At the same time, TEM study has evidenced the presence of thin martensite plates which appear just at the beginning of the (massive) martensite formation and growth. The martensite plate growth rate is quite low and non continuous. While high internal friction in the transition domain is usually associated with the mobility between martensite/austenite interfaces, the present internal friction anomaly has been ascribed to the unstable motions of the first martensite plates.
PACS: 81.30.Kf – Martensitic transformations / 61.72.Ff – Direct observation of dislocations and other defects (etch pits, decoration, electron microscopy, X-ray topography, etc.) / 61.72.Hh – Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.)
© EDP Sciences, 2001
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