Eur. Phys. J. AP
Volume 6, Number 3, June 1999
|Page(s)||323 - 329|
|Published online||15 June 1999|
Determination of viscoelastic moduli at a submicrometric scale
ESPCI/LPQ, Systèmes Interfaciaux à l'Échelle Nanométrique (ESA 7069 du CNRS),
10 rue Vauquelin, 75231 Paris, Cedex 05, France
2 Rhodia Recherches, 52 rue de la Haie Coq, 93308 Aubervilliers Cedex, France
Corresponding author: email@example.com
Accepted: 8 March 1999
Published online: 15 June 1999
From an analysis of the static friction regime of the tip of an atomic force microscope, a method is proposed for determining the viscoelastic modulus of materials which are viscoelastic at the temperature of the experiment. Present experiments consist in displacing the sample in its plane, periodically or at a constant velocity, while measuring the tangential force response of the contact to this shear solicitation. The proposed model permits to determine the relaxation and complex moduli at a sub-micrometric scale. Several experimental confirmations of the description are presented and it is shown that the local moduli measurements compare favorably with macroscopical results.
PACS: 68.10.Et – Interface elasticity, viscosity, and viscoelasticity / 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc.
© EDP Sciences, 1999
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