Eur. Phys. J. AP
Volume 6, Number 3, June 1999
|Page(s)||281 - 284|
|Published online||15 June 1999|
Electronic speckle pattern shearing interferometry for determining free convection heat transfer coefficient
INFM – Dipartimento di Ingegneria Elettronica, Università di Roma Tre, via
Della Vasca Navale 84, 00146 Roma, Italy
2 INFM – Dipartimento di Energetica, Università di L'Aquila, Loc. Monteluco di Roio, 67040 Roio Poggio (AQ), Italy
Corresponding author: Giuseppe.Schirripa@ele.uniroma3.it
Revised: 11 January 1999
Accepted: 8 February 1999
Published online: 15 June 1999
An electronic speckle-pattern shearing interferometer (ESPSI) is proposed for measuring the free convection heat transfer coefficient in liquids. The heat transfer coefficient may be deduced by a simple manipulation of the speckle patterns. Theory of the method as well as its application are presented. The method is robust and easy to use for non-skilled operators.
PACS: 42.30.-d – Imaging and optical processing / 44.90.+c – Other topics in heat transfer
© EDP Sciences, 1999
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