| Issue |
Eur. Phys. J. AP
Volume 6, Number 3, June 1999
|
|
|---|---|---|
| Page(s) | 281 - 284 | |
| DOI | https://doi.org/10.1051/epjap:1999174 | |
| Published online | 15 June 1999 | |
https://doi.org/10.1051/epjap:1999174
Electronic speckle pattern shearing interferometry for determining free convection heat transfer coefficient
1
INFM – Dipartimento di Ingegneria Elettronica, Università di Roma Tre, via
Della Vasca Navale 84, 00146 Roma, Italy
2
INFM – Dipartimento di Energetica, Università di L'Aquila, Loc. Monteluco di
Roio, 67040 Roio Poggio (AQ), Italy
Corresponding author: Giuseppe.Schirripa@ele.uniroma3.it
Received:
6
May
1998
Revised:
11
January
1999
Accepted:
8
February
1999
Published online: 15 June 1999
An electronic speckle-pattern shearing interferometer (ESPSI) is proposed for measuring the free convection heat transfer coefficient in liquids. The heat transfer coefficient may be deduced by a simple manipulation of the speckle patterns. Theory of the method as well as its application are presented. The method is robust and easy to use for non-skilled operators.
PACS: 42.30.-d – Imaging and optical processing / 44.90.+c – Other topics in heat transfer
© EDP Sciences, 1999
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