| Issue |
Eur. Phys. J. AP
Volume 5, Number 3, March 1999
|
|
|---|---|---|
| Page(s) | 297 - 301 | |
| DOI | https://doi.org/10.1051/epjap:1999142 | |
| Published online | 15 March 1999 | |
https://doi.org/10.1051/epjap:1999142
Wavelet analysis of near-field data and the resolution problem*
1
Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Université de
Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
2
CERAH, Laboratoire d'Optique P.M. Duffieux (UMR 6603 CNRS), Université de
Franche-Comté, Institut des Microtechniques, 25030 Besançon Cedex, France
Corresponding author: dominique.barchiesi@univ-fcomte.fr
Received:
2
July
1998
Revised:
6
November
1998
Accepted:
26
November
1998
Published online: 15 March 1999
In Near-Field Optical microscopy, the resolution is directly related to the experimental conditions of illumination and separation between tip and sample. In general, there is no well-defined linear transfer function of the measurement system. The local resolution can be described by the signal-to-noise ratio, by the separation of individual objects or in terms of data shape sharpness. In this paper we use wavelet analysis to determine local resolution. We deduce the resolution from the characteristics of the wavelet and with the help of the local energy in the decomposition.
PACS: 07.79.Fc – Near-field scanning optical microscopes / 42.30.Va – Image forming and processing / 61.16.Ch – Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc.
© EDP Sciences, 1999
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