Issue |
Eur. Phys. J. Appl. Phys.
Volume 27, Number 1-3, July-September 2004
Tenth International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP X)
|
|
---|---|---|
Page(s) | 431 - 433 | |
Section | Multi-techniques investigations | |
DOI | https://doi.org/10.1051/epjap:2004068 | |
Published online | 15 July 2004 |
https://doi.org/10.1051/epjap:2004068
Wavy growth and related defects in strain-balanced multi-quantum wells for photovoltaic devices
CNR-IMEM Institute, Parco Area delle Scienze 37/A, I-43010
Fontanini-Parma, Italy
Corresponding author: laura@imem.cnr.it
Received:
25
July
2003
Accepted:
10
February
2004
Published online: 15 July 2004
Transmission electron microscopy, high resolution X-ray diffraction, cathodoluminescence were performed on strain balanced InGaAs based multi-quantum wells (MQWs) to be used as active layers in thermophotovoltaic devices operating at around 2 µm. The epitaxial growth front in the MQWs is flat up to a certain thickness where a change in the growth mode generates MQW waviness propagating vertically through the structure with increasing amplitude. The local stress concentration in the MQW regions exhibiting significant local rippling results in the formation of clusters of extended defects whose properties vary according to the strain and the growth temperature conditions of the structures. Experimentally it has been found that the wavy growth onset occurs once a threshold value of the elastic energy density is achieved. The well/barrier thickness ratio were changed in order to minimize this threshold energy and thus to retain good material quality even at the longer wavelength. Forty repetitions defect free MQWs, emitting at 1.96 µm at room temperature were successfully grown in this way.
PACS: 81.07.St – Quantum wells / 68.35.Ct – Interface structure and roughness / 81.05.Ea – III-V semiconductors
© EDP Sciences, 2004
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.