| Issue |
Eur. Phys. J. AP
Volume 5, Number 3, March 1999
|
|
|---|---|---|
| Page(s) | 277 - 281 | |
| DOI | https://doi.org/10.1051/epjap:1999140 | |
| Published online | 15 March 1999 | |
https://doi.org/10.1051/epjap:1999140
Spectroscopic study of resonant dielectric structures in near-field*
Laboratoire d'Optique P.M. Duffieux (CNRS UMR 6603), Université de
Franche-Comté, Institut des Microtechniques,
25030 Besançon Cedex, France
Corresponding author: dominique.barchiesi@univ-fcomte.fr
Received:
2
July
1998
Revised:
29
September
1998
Accepted:
29
October
1998
Published online: 15 March 1999
Gratings can be considered as resonant structures in near-field. The enhancement of the intensity recorded by Scanning Near-Field Optical Microscopes (SNOM) is due to interferences in relation with the ratio of the wavelength to the product of the optical index by the period of the grating. We discuss the effect of this ratio (in the range 0.9, 1.1) on the intensity patterns. The influence of the polarization on near-field data is analyzed in both theoretical computations and experimental result.
PACS: 07.79.Fc – Near-field scanning optical microscopes
© EDP Sciences, 1999
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