Issue |
Eur. Phys. J. Appl. Phys.
Volume 64, Number 3, December 2013
|
|
---|---|---|
Article Number | 30401 | |
Number of page(s) | 8 | |
Section | Nanomaterials and Nanotechnologies | |
DOI | https://doi.org/10.1051/epjap/2013130347 | |
Published online | 09 December 2013 |
https://doi.org/10.1051/epjap/2013130347
Synthesis of nanocrystalline NiAl by mechanically activated self-propagating high-temperature synthesis and mechanically activated annealing process
1 Laboratoire d’Étude et de Recherche des États Condensés (LEREC), Département de physique, Faculté des Sciences, Université d’Annaba, BP 12, 23000 Annaba, Algéria
2
École Préparatoire aux Sciences et Techniques (EPST), BP 218, Annaba, Algéria
3
Université Mohamed Khider, BP 145, RP 07000, Biskra, Algéria
4
LSPM, UPR 3407, CNRS, 99 av. J.B. Clément, 93430 Villetaneuse, France
a e-mail: arroussi.soumia@gmail.com
Received:
24
July
2013
Revised:
18
September
2013
Accepted:
30
September
2013
Published online:
9
December
2013
The mechanically activated self-propagating high-temperature synthesis (MASHS) technique and the mechanically activated annealing process (M2AP) were used to produce NiAl intermetallic compound. Rietveld analysis of X-ray diffraction data was used to characterize the mechanically activated powders, MASHS and M2AP end-products. Two-phase (B2+L12) nickel aluminide intermetallic compounds were synthesized by the mechanically activated volume combustion synthesis (MASHS). A single phase B2 NiAl was formed when mechanically activated annealing process (M2AP) was performed. Starting from a mixture of elemental pure powders, both M2AP and MASHS milling processes lead to nanostructured powders. Structural analysis deduced from the Rietveld refinement of X-ray diffraction patterns of NiAl compounds synthesized by SHS after a milling of 6 h show the formation of β-NiAl phase with a cell parameter a = (0.2885 ± 1.2618 × 10−4) nm. The average crystallite size is D = (44.6421 ± 2.4263) nm and the microstrains values are close to those of metallic alloys τ = (0.2142 ± 1.6186 × 10−2)%. Finally, scanning electron microscopy (SEM) was carried out to characterize the microstructure of end-products.
© EDP Sciences, 2013
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