The European Physical Journal Applied Physics (EPJ AP)

Raman investigation of stress and phase transformation induced in silicon by indentation at high temperatures

S. Kouteva-Arguirova, V. Orlov, W. Seifert, J. Reif and H. Richter

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 279-283

Published online: 15 July 2004

DOI: 10.1051/epjap:2004144

S. Kouteva-Arguirova

V. Orlov

W. Seifert

J. Reif

H. Richter

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