The European Physical Journal Applied Physics (EPJ AP)

Detection and characterization of stacking faults by light beam induced current mapping and scanning infrared microscopy in silicon

C. Vève-Fossati and S. Martinuzzi

Eur. Phys. J. AP, 3 2 (1998) 123-126

Published online: 15 August 1998

DOI: 10.1051/epjap:1998214

C. Vève-Fossati

S. Martinuzzi

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