The European Physical Journal Applied Physics (EPJ AP)

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Defects in SiC substrates and epitaxial layers affecting semiconductor device performance

St. G. Müller, J. J. Sumakeris, M. F. Brady, R. C. Glass, H. McD. Hobgood, J. R. Jenny, R. Leonard, D. P. Malta, M. J. Paisley, A. R. Powell et al. (5 more)

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 29-35

Published online: 15 July 2004

DOI: 10.1051/epjap:2004085

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V. F. Tsvetkov

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The European Physical Journal Applied Physics (EPJ AP)

Editors-in-Chief: Vincent Mauchamp and Philippe Moreau - Editorial board
ISSN: 1286-0042 - eISSN: 1286-0050
Frequency: monthly
Copyright / Published by: EDP Sciences

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