The European Physical Journal Applied Physics (EPJ AP)

Microstructural characterization of porous silicon for use in optoelectronic devices

D. Abidi, S. Romdhane, A. Brunet-Bruneau and J.-L. Fave

Eur. Phys. J. Appl. Phys., 45 1 (2009) 10601

Published online: 14 January 2009

DOI: 10.1051/epjap:2008192

D. Abidi

S. Romdhane

A. Brunet-Bruneau

J.-L. Fave

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