The European Physical Journal Applied Physics (EPJ AP)

Suppression of leakage currents in GaN-based LEDs induced by reactive-ion etching damages

M. Mosca, A. Castiglia, H.-J. Bühlmann, J. Dorsaz, E. Feltin, J.-F. Carlin and N. Grandjean

Eur. Phys. J. Appl. Phys., 43 1 (2008) 51-53

Published online: 19 June 2008

DOI: 10.1051/epjap:2008119

M. Mosca

A. Castiglia

H.-J. Bühlmann

J. Dorsaz

E. Feltin

J.-F. Carlin

N. Grandjean

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